Description:

STN offers four sequence-searchable databases—CAS REGISTRY, DGENE, PCTGEN, and USGENE. While each of these databases has its own unique information and indexing, you can perform BLAST similarity and motif (Sequence Code Match) searching with all four. These STN sequence databases offer more timely information than those of other sources.  Another benefit of STN is that the REGISTRY and DGENE sequences have been intellectually indexed by scientists who are expert in that area.

 

This workshop will show you how to make maximum use of the comprehensive sequence searching resources on STN.  In addition to the basic steps of BLAST and motif searching, the workshop covers techniques for searching unique sequence modifications and uncommon sequences.  Also included is the use of special characters and symbols to specify specific location(s) within a sequence with uncertain residues.

 

See how the new search techniques of STN Express, Version 8.4 can make your sequence searching more comprehensive and efficient.  New post-processing tools will save you time while increasing the appearance and readability of your STN sequence searches.  These tools include: 

• the new Patent Family Manager, which creates a concise display of results
• a BLAST alignment sequence data report 

 

In this workshop you will learn how to:

• identify and understand the types of sequence databases on STN
• run a BLAST search in the CAS REGISTRY, DGENE, PCTGEN, and USGENE 
• perform a sequence Code Match Search in REGISTRY, DGENE, PCTGEN, and USGENE
• use sequence search techniques for DGENE, PCTGEN, and USGENE
• perform a FASTA similarity search in DGENE, PCTGEN, and USGENE
• combine sequence searches into a multi-file search

Each session will have extensive hands-on practice time

 

 

Who should attend?

Patent examiners, search professionals, technical specialists, and sequence-focused searchers.